GKS-075 306 120 A 2000
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Product Details• Probes proven through numerous field validations, suitable for probing printed circuit boards (PCBs).
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• A diverse range of tip shapes with varying diameters and surface finishes are available, ensuring optimal contact with test points (e.g., pads, vias and pins).
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• Various spring forces are offered, along with stainless steel spring versions designed for high-temperature probing applications.
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• Multiple mounting heights can be achieved by combining the probes with different types of probe sleeves, enabling the configuration of optimal stroke conditions in test fixtures.
| Technical Specifications | |||
| Product Group: | Standard Stroke Spring Probes | Product Group: | ICT / FCT (In-Circuit & Functional Test) |
| Sub-Product Group: | Standard Stroke Spring Probes | Construction Series: | GKS-075 |
| Grid: | 1.91 mm | Probing Target: | Pins |
| Probing Target: | Flat Contacts | Probing Target: | Terminals |
| Electromagnetic Compatibility: | Yes | Mounting Type: | Plug-in Type |
| Quick-Change System: | Yes | Adjustable Mounting Height: | No |
| Anti-Twist: | No | Suitable Probe Sleeves: | KS-075 |
| Minimum Temperature: | -40 °C | Maximum Temperature: | 80 °C |
| RoHS Compliance: | Yes | ||
